ATE charger adapter test system, power supply automation test system, direct sales from the manufacturer, ate tester
1. High degree of automation enhances testing efficiency
Automatically execute the test process: Through preset programs, automatically complete tests on input/output characteristics, protection functions, energy efficiency, etc., reducing manual operation time.
Multi-channel parallel testing: Supports simultaneous testing of multiple power supply samples, significantly shortening the batch testing cycle (such as full inspection of fast charging power sources on the production line).
7× 24-hour continuous operation: Suitable for scenarios such as aging tests and life tests, no manual intervention is required.
2. High testing accuracy and traceable data
Accurately measure key parameters:
Voltage/current accuracy: Up to 0.1% range accuracy (such as output from a 5V/1A adapter).
Ripple noise: Resolution up to 1mVpp (oscilloscope-level measurement).
Energy efficiency test: The error of the power analyzer is <0.5% (meeting the DoE/ Energy Star standard).
Eliminate human errors: Automate data collection to avoid deviations from manual reading or recording.
Data storage and traceability: Test results are automatically generated into Excel/PDF reports, supporting barcode scanning to associate sample information.
3. Cover all test items
Basic performance test:
Input voltage range (such as 90V to 264VAC), inrush current, no-load power consumption.
Output voltage/current stability, load regulation rate, dynamic response.
Verification of protection function
The protection mechanisms such as overvoltage (OVP), overcurrent (OCP), short circuit (SCP), and over-temperature (OTP) are triggered for testing.
Environmental adaptability test
Simulation of extreme conditions such as high and low temperatures (-40℃ to +85℃), humidity and heat (95% RH), vibration/shock, etc.
Special scenario testing
Fast charging protocol compatibility (PD3.0/QC4.0/PPS), audio noise, electromagnetic compatibility (EMC), etc.
4. Safety and reliability guarantee
Isolation Design and Protection
The high-voltage test section adopts electrical isolation to avoid operational risks (such as leakage current <1mA during withstand voltage testing).
The output is automatically cut off during short-circuit/overload testing to protect the equipment and samples.
Abnormal alarm and log
Real-time monitoring of the test status, over-limit alarm and recording of abnormal events (such as excessively high temperature and sudden voltage changes).
Long-term stability
It is suitable for aging tests (such as 1000 hours of full-load operation) to expose potential faults in advance.
| Test items | Comprehensive Test items |
| CEC test | Short circuit test |
| DC Current under C.V.Mode | Short circuit current |
| Peak-Peak noise | OV protection |
| Serial reaction time test | UV protection |
| Transient response time | OL protection |
| Transient spike | OP protection |
| Tracking | In-test adjustment test |
| Voltage regulation | AC cycle drop out |
| Current regulation | PLD simulation |
| Turn ON time | DC output current test |
| Rise time | DC output voltage test |
| Fall time | Waveform read test |
| Hold-up time | Input impulse current test |
| Inrush current test | Input power |
| Power good signal | Relay control |
| Power fail signal | Bar code scan |
| P/S ON signal | Dynamic test |
| Power up sequence | Specification under C.P.Mode |
| Power off sequence | Input Peak current |
| Effciency test | Additional expansion measurement test |
| Overall stability test | Input RMS current |
| Fan Speed test | TTL signal control |
| Input power factor | LAN read/write |
| Input voltage ramp | RS485 read/write |
| Input freq. ramp | USB read/write |
| Extend the measurement test | 232 read/write |
| Automatic test | GPIB read/write |
Product Tags:
|
|
ATE Charger Adapter Test System Power Supply Automation Test System Ate Tester Images
|
